XPS and SIMS studies of CVD-grown cubic SiC films on Si(100)
Materials Research Society Symposium - Proceedings
Saved in:
Main Authors: | Wee, A.T.S., Feng, Z.C., Hng, H.H., Tan, K.L., Tin, C.C., Hu, R., Coston, R. |
---|---|
其他作者: | PHYSICS |
格式: | Conference or Workshop Item |
出版: |
2014
|
在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/98954 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
機構: | National University of Singapore |
相似書籍
-
Combined structural and optical assessment of CVD grown 3C-SiC/Si
由: Feng, Z.C., et al.
出版: (2014) -
Raman and Rutherford backscattering analyses of cubic SiC thin films grown on Si by vertical chemical vapor deposition
由: Feng, Z.C., et al.
出版: (2014) -
Surface chemical states on 3C-SiC/Si epilayers
由: Wee, A.T.S., et al.
出版: (2014) -
XPS and SIMS studies of MBE-grown CdTe/InSb(001) heterostructures
由: Wee, A.T.S., et al.
出版: (2014) -
Surface chemical states on LPCVD-grown 4H-SiC epilayers
由: Wee, A.T.S., et al.
出版: (2014)