Dislocations and traps in MBE grown lattice mismatched p-InGaAs/GaAs layers on GaAs substrates

بواسطة Du, A.Y., Li, M.F., Chong, T.C., Zhang, Z.
منشور في 2014

Dopant loss mechanism in n+/p germanium junctions during rapid thermal annealing

بواسطة Poon, C.H., Tan, L.S., Cho, B.J., Du, A.Y.
منشور في 2014

Carrier concentration saturation in n type AlxGa1-xAs

بواسطة Du, A.Y., Li, M.F., Chong, T.C., Chua, S.J.
منشور في 2014

Comment on "direct evidence for the negative-U nature of the DX center in AlxGa1-xAs"

بواسطة Li, M.F., Du, A.Y., Luo, Y.Y., Chua, S.J.
منشور في 2014

Schottky barrier tuning at NiSi/Si interface using pre-silicide aluminum and sulfur co-implant

بواسطة Tong, Y., Koh, S.-M., Zhou, Q., Du, A.Y., Yeo, Y.-C.
منشور في 2014

Observation of carrier concentration saturation effect in n-type AlxGa1-xAs

بواسطة Du, A.Y., Li, M.F., Chong, T.C., Chua, S.J.
منشور في 2014

Deep level states caused by dislocations in MBE grown p-InGaAs/GaAs heterostructures

بواسطة Du, A.Y., Li, M.F., Chong, T.C., Teo, K.L., Lau, W.S.
منشور في 2014

Growth of Bismuth Sulfide Nanowire Using Bismuth Trisxanthate Single Source Precursors

بواسطة Koh, Y.W., Lai, C.S., Du, A.Y., Tiekink, E.R.T., Loh, K.P.
منشور في 2014

Dislocations and related traps in p-InGaAs/GaAs lattice-mismatched heterostructures

بواسطة Du, A.Y., Li, M.F., Chong, T.C., Teo, K.L., Lau, W.S., Zhang, Z.
منشور في 2014

Confinement of nanocrystals and possible charge storage mechanism for MIS memory devices with ge nanocrystals embedded in SiO 2

بواسطة Ho, V., Choi, W.K., Chim, W.K., Teo, L.W., Du, A.Y., Tung, C.H.
منشور في 2014

Investigation of dislocations and traps in MBE grown p-InGaAs/GaAs heterostructures

بواسطة Du, A.Y., Li, M.F., Chong, T.C., Xu, S.J., Zhang, Z., Yu, D.P.
منشور في 2014

Formation of dual-phase HfO 2-Hf xSi 1-xO 2 dielectric and its application in memory devices

بواسطة Wang, Y.Q., Chen, J.H., Yoo, W.J., Yeo, Y.-C., Chin, A., Du, A.Y.
منشور في 2014

Mobility enhancement in TaN metal-gate MOSFETs using tantalum incorporated HfO2 gate dielectric

بواسطة Yu, X., Zhu, C., Li, M.F., Chin, A., Yu, M.B., Du, A.Y., Kwong, D.-L.
منشور في 2014

Pulsed laser annealing of ultra-shallow junctions in silicon-germanium

بواسطة Tan, L.S., Tan, J.Y., Begum, A., Hong, M.H., Du, A.Y., Bhat, M., Wang, X.C.
منشور في 2014

Electrical characteristics and suppressed boron penetration behavior of thermally stable HfTaO gate dielectrics with polycrystalline-silicon gate

بواسطة Yu, X., Zhu, C., Li, M.F., Chin, A., Du, A.Y., Wang, W.D., Kwong, D.-L.
منشور في 2014

Crystalline amorphous semiconductor superlattice

بواسطة Chong, T.C., Shi, L.P., Wei, X.Q., Zhao, R., Lee, H.K., Yang, P., Du, A.Y.
منشور في 2014

Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel...

بواسطة Ng, T.H., Chim, W.K., Choi, W.K., Ho, V., Teo, L.W., Du, A.Y., Tung, C.H.
منشور في 2014

Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-x Gex films

بواسطة Ko, V., Teo, K.L., Liew, T., Chong, T.C., Liu, T., Wee, A.T.S., Du, A.Y., Stoffel, M., Schmidt, O.G.
منشور في 2014

Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal-insulator-semiconductor structures and current transport mechanisms

بواسطة Chim, W.K., Ng, T.H., Koh, B.H., Choi, W.K., Zheng, J.X., Tung, C.H., Du, A.Y.
منشور في 2014

Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanisms

بواسطة Ng, T.H., Koh, B.H., Chim, W.K., Choi, W.K., Zheng, J.X., Tung, C.H., Du, A.Y.
منشور في 2014