A framework to practical predictive maintenance modeling for multi-state systems

by Tan, Cher Ming, Raghavan, Nagarajan
Published 2013

Statistical modeling of via redundancy effects on interconnect reliability

by Tan, Cher Ming, Raghavan, Nagarajan
Published 2010

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

by Tan, Cher Ming, Raghavan, Nagarajan
Published 2010

Analysis of correlated gate and drain random telegraph noise in post-soft breakdownTiN/HfLaO/SiOx nMOSFETs

by Liu, Wenhu, Padovani, Andrea, Larcher, Luca, Raghavan, Nagarajan, Pey, Kin Leong
Published 2014

Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching

by Raghavan, Nagarajan, Pey, Kin Leong, Wu, Xing, Liu, Wenhu, Bosman, Michel
Published 2013

Comparative study of non-standard power diodes

by Tan, Cher Ming, Raghavan, Nagarajan, Sun, Lina, Hsu, Chuck, Wang, Chase
Published 2010

Dielectric breakdown - recovery in logic and resistive switching in memory : bridging the gap between the two phenomena

by Pey, Kin Leong, Raghavan, Nagarajan, Wu, Xing, Liu, Wenhu, Bosman, Michel
Published 2013

A rapid design exploration framework under additive manufacturing process uncertainty

by Xiong, Yi, Duong, Pham Luu Trung, Raghavan, Nagarajan, Rosen, David W
Published 2018

Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications

by Liu, W. H., Pey, Kin Leong, Raghavan, Nagarajan, Wu, X., Bosman, Michel
Published 2013

Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks

by Raghavan, Nagarajan, Pey, Kin Leong, Shubhakar, K., Wu, X., Liu, W. H., Bosman, Michel
Published 2013

Resilience of ultra-thin oxynitride films to percolative wear-out and reliability implications for high-κ stacks at low voltage stress

by Raghavan, Nagarajan, Padovani, Andrea, Li, Xiang, Bosman, Michel, Wu, Xing, Lip Lo, Vui, Larcher, Luca, Leong Pey, Kin
Published 2013

Exploring the impact of variability in resistance distributions of RRAM on the prediction accuracy of deep learning neural networks

by Prabhu, Nagaraj Lakshmana, Loy, Desmond Jia Jun, Dananjaya, Putu Andhita, Lew, Wen Siang, Toh, Eng Huat, Raghavan, Nagarajan
Published 2021

Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

by Sahay, Rahul, Tu, Yen-Cheng, Aziz, Izzat, Budiman, Arief S., Tan, Cher Ming, Lee, Pooi See, Thomas, Olivier, Raghavan, Nagarajan
Published 2024

Atomic scale modulation of self‐rectifying resistive switching by interfacial defects

by Wu, Xing, Yu, Kaihao, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xixiang, Li, Kun, Liu, Qi, Sun, Litao, Pey, Kinleong
Published 2018

Intrinsic nanofilamentation in resistive switching

by Migas, Dmitri B., Borisenko, Victor E., Wu, Xing, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xi Xiang, Li, Kun, Pey, Kin Leong
Published 2014

Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction

by Navarro, Etienne, Cornelius, Thomas W., Proudhon, Henry, Sahay, Rahul, Radchenko, Ihor, Escoubas, Stephanie, Lee, Pooi See, Raghavan, Nagarajan, Budiman, Arief S., Thomas, Olivier
Published 2023

Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEM

by Shubhakar, K., Pey, Kin Leong, Bosman, Michel, Thamankar, R., Kushvaha, S. S., Loke, Y. C., Wang, Z. R., Raghavan, Nagarajan, Wu, X., O'Shea, S. J.
Published 2013