A framework to practical predictive maintenance modeling for multi-state systems

由 Tan, Cher Ming, Raghavan, Nagarajan
出版 2013

Statistical modeling of via redundancy effects on interconnect reliability

由 Tan, Cher Ming, Raghavan, Nagarajan
出版 2010

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

由 Tan, Cher Ming, Raghavan, Nagarajan
出版 2010

Analysis of correlated gate and drain random telegraph noise in post-soft breakdownTiN/HfLaO/SiOx nMOSFETs

由 Liu, Wenhu, Padovani, Andrea, Larcher, Luca, Raghavan, Nagarajan, Pey, Kin Leong
出版 2014

Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching

由 Raghavan, Nagarajan, Pey, Kin Leong, Wu, Xing, Liu, Wenhu, Bosman, Michel
出版 2013

Comparative study of non-standard power diodes

由 Tan, Cher Ming, Raghavan, Nagarajan, Sun, Lina, Hsu, Chuck, Wang, Chase
出版 2010

Dielectric breakdown - recovery in logic and resistive switching in memory : bridging the gap between the two phenomena

由 Pey, Kin Leong, Raghavan, Nagarajan, Wu, Xing, Liu, Wenhu, Bosman, Michel
出版 2013

A rapid design exploration framework under additive manufacturing process uncertainty

由 Xiong, Yi, Duong, Pham Luu Trung, Raghavan, Nagarajan, Rosen, David W
出版 2018

Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications

由 Liu, W. H., Pey, Kin Leong, Raghavan, Nagarajan, Wu, X., Bosman, Michel
出版 2013

Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks

由 Raghavan, Nagarajan, Pey, Kin Leong, Shubhakar, K., Wu, X., Liu, W. H., Bosman, Michel
出版 2013

Resilience of ultra-thin oxynitride films to percolative wear-out and reliability implications for high-κ stacks at low voltage stress

由 Raghavan, Nagarajan, Padovani, Andrea, Li, Xiang, Bosman, Michel, Wu, Xing, Lip Lo, Vui, Larcher, Luca, Leong Pey, Kin
出版 2013

Exploring the impact of variability in resistance distributions of RRAM on the prediction accuracy of deep learning neural networks

由 Prabhu, Nagaraj Lakshmana, Loy, Desmond Jia Jun, Dananjaya, Putu Andhita, Lew, Wen Siang, Toh, Eng Huat, Raghavan, Nagarajan
出版 2021

Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

由 Sahay, Rahul, Tu, Yen-Cheng, Aziz, Izzat, Budiman, Arief S., Tan, Cher Ming, Lee, Pooi See, Thomas, Olivier, Raghavan, Nagarajan
出版 2024

Atomic scale modulation of self‐rectifying resistive switching by interfacial defects

由 Wu, Xing, Yu, Kaihao, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xixiang, Li, Kun, Liu, Qi, Sun, Litao, Pey, Kinleong
出版 2018

Intrinsic nanofilamentation in resistive switching

由 Migas, Dmitri B., Borisenko, Victor E., Wu, Xing, Cha, Dongkyu, Bosman, Michel, Raghavan, Nagarajan, Zhang, Xi Xiang, Li, Kun, Pey, Kin Leong
出版 2014

Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction

由 Navarro, Etienne, Cornelius, Thomas W., Proudhon, Henry, Sahay, Rahul, Radchenko, Ihor, Escoubas, Stephanie, Lee, Pooi See, Raghavan, Nagarajan, Budiman, Arief S., Thomas, Olivier
出版 2023

Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEM

由 Shubhakar, K., Pey, Kin Leong, Bosman, Michel, Thamankar, R., Kushvaha, S. S., Loke, Y. C., Wang, Z. R., Raghavan, Nagarajan, Wu, X., O'Shea, S. J.
出版 2013