Teaching semiconductor device physics with two-dimensional numerical solver

由 Yeow, Y.T., Ling, C.H.
出版 2014

A high return loss of microwave bandpass filter using superconducting electrospun YBCO nanostructures

由 Jasim, S. E., Jusoh, M. A., Yeow, Y. K., Jose, R.
出版 2018

Electromagnetic shielding effectiveness of gypsum-magnetite composite at x-band frequency

由 Jusoh, M. A., Yeow, Y. K., Nazlan, R., Esa, F.
出版 2019

Effect of blowing agent to the dielectric properties of polyurethane-empty fruit bunch composite in x-band frequency

由 Mahmud, S. N. S., Jusoh, M. A., Yeow, Y. K., Esa, F.
出版 2020

Electromagnetic shielding effectiveness of gypsum-magnetite composite at x-band frequency

由 Mohamad Ashry, Jusoh, Yeow, Y. K., Rodziah, Nazlan, Fahmiruddin, Esa
出版 2019

A High Return Loss of Microwave Bandpass Filter Using Superconducting Electrospun YBCO Nanostructures

由 Jasim, S. E., M. A., Jusoh, Yeow, Y. K., Rajan, Jose
出版 2018

Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals

由 Ang, D.S., Ling, C.H., Yeow, Y.T.
出版 2014

Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement

由 Yeow, Y.T., Ling, C.H., Ah, L.K.
出版 2014

Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements

由 Ling, C.H., Yeow, Y.T., Ah, L.K.
出版 2014

Modelling of the "Gated-diode" configuration in bulk MOSFET's

由 Yip, A., Yeow, Y.T., Samudra, G.S., Ling, C.H.
出版 2014

Dopant profile extraction by inverse modeling of scanning capacitance microscopy using peak dC/dV

由 Hong, Y.D., Yan, J., Wong, K.M., Yeow, Y.T., Chim, W.K.
出版 2014

Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement

由 Hong, Y.D., Yeow, Y.T., Chim, W.K., Yan, J., Wong, K.M.
出版 2014

Dopant extraction from scanning capacitance microscopy measurements of p-n junctions using combined inverse modeling and forward simulation

由 Chim, W.K., Wong, K.M., Teo, Y.L., Lei, Y., Yeow, Y.T.
出版 2014

Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

由 Hong, Y.D., Yeow, Y.T., Chim, W.-K., Wong, K.-M., Kopanski, J.J.
出版 2014

Logarithmic time dependence of pMOSFET degradation observed from gate capacitance

由 Ling, C.H., Yeow, Y.T., Ah, L.K., Yung, W.H., Choi, W.K.
出版 2014

Beam controller antenna for WiMAX application

由 Leong, L. W., Hoon, W. F., Yeow, Y. K., Malek, M. A., Yew, L. C., Seng, L. Y., Rosli, S. J.
出版 2017

Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy Measurements

由 Chim, W.K., Wong, K.M., Yeow, Y.T., Hong, Y.D., Lei, Y., Teo, L.W., Choi, W.K.
出版 2014