RF characterization and design of multi-TSV with embedded capacitor

This paper presents RF characterization and design of multi-TSV with embedded capacitor up to 10GHz. The capacitor is embedded around the TSV structure prior to Cu filling to utilize the vertical dimension, and thus improves the capacitance density and silicon area utilization. Here, the capacitance...

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Bibliographic Details
Main Authors: Panwar, Neeraj, Apriyana, Anak Agung Alit, Lin, Ye, Tan, Chuan Seng
Other Authors: School of Electrical and Electronic Engineering
Format: Conference or Workshop Item
Language:English
Published: 2020
Subjects:
Online Access:https://hdl.handle.net/10356/144081
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Institution: Nanyang Technological University
Language: English