RF characterization and design of multi-TSV with embedded capacitor
This paper presents RF characterization and design of multi-TSV with embedded capacitor up to 10GHz. The capacitor is embedded around the TSV structure prior to Cu filling to utilize the vertical dimension, and thus improves the capacitance density and silicon area utilization. Here, the capacitance...
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Main Authors: | , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2020
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/144081 |
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Institution: | Nanyang Technological University |
Language: | English |