Three-dimensional modeling of near-field beam profiles from grating couplers using a deep neural network
Integrated silicon photonics (SiPh) gratings have been widely studied for the optical addressing of trapped ions. As the formfactor of ion traps reduces, the ion-trapping height decreases, and may unavoidably fall into the reactive near-field region of SiPh gratings. In this study, a deep neural net...
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Main Authors: | Lim, Yu Dian, Tan, Chuan Seng |
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其他作者: | School of Electrical and Electronic Engineering |
格式: | Article |
語言: | English |
出版: |
2024
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在線閱讀: | https://hdl.handle.net/10356/179964 |
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