Three-dimensional modeling of near-field beam profiles from grating couplers using a deep neural network

Integrated silicon photonics (SiPh) gratings have been widely studied for the optical addressing of trapped ions. As the formfactor of ion traps reduces, the ion-trapping height decreases, and may unavoidably fall into the reactive near-field region of SiPh gratings. In this study, a deep neural net...

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Main Authors: Lim, Yu Dian, Tan, Chuan Seng
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2024
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在線閱讀:https://hdl.handle.net/10356/179964
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