Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution
The effect of bonding duration and substrate temperature on the nano-scale interfacial structure for bonding strength were investigated using high resolution transmission electron microscopy. It shows that intermetallic compound crystallization correlates with bonding duration, as a lo...
Saved in:
Main Authors: | , , , , , |
---|---|
Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2012
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/79549 http://hdl.handle.net/10220/8242 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-79549 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-795492023-07-14T15:57:28Z Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution Xu, Hui Liu, Changqing Chen, Z. Wei, J. Sivakumar, M. Silberschmidt, Vadim V. School of Materials Science & Engineering DRNTU::Engineering::Materials The effect of bonding duration and substrate temperature on the nano-scale interfacial structure for bonding strength were investigated using high resolution transmission electron microscopy. It shows that intermetallic compound crystallization correlates with bonding duration, as a longer duration is applied, alumina fragmentation becomes pervasive, resulting in continuous alloy interfaces and robust bonds. In addition, a substrate temperature (i.e. 175 C) promotes the fracture of alumina, and simultaneously contributes to the interfacial temperature, accelerating interdiffusion and facilitating the formation of intermetallic compounds, therefore increasing bonding strength. The compound formed during bonding is CuAl2, regardless of the bonding parameters applied. Accepted version 2012-06-27T02:57:34Z 2019-12-06T13:28:02Z 2012-06-27T02:57:34Z 2019-12-06T13:28:02Z 2010 2010 Journal Article Xu, H., Liu, C., Silberschmidt, V. V., Chen, Z., Wei, J., & Sivakumar, M. (2011). Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads: a TEM study of interfacial evolution. Microelectronics reliability, 51(1), 113-118. 0026-2714 https://hdl.handle.net/10356/79549 http://hdl.handle.net/10220/8242 10.1016/j.microrel.2010.03.016 en Microelectronics reliability © 2010 Elsevier. This is the author created version of a work that has been peer reviewed and accepted for publication by Microelectronics Reliability, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.microrel.2010.03.016]. application/pdf |
institution |
Nanyang Technological University |
building |
NTU Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NTU Library |
collection |
DR-NTU |
language |
English |
topic |
DRNTU::Engineering::Materials |
spellingShingle |
DRNTU::Engineering::Materials Xu, Hui Liu, Changqing Chen, Z. Wei, J. Sivakumar, M. Silberschmidt, Vadim V. Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution |
description |
The effect of bonding duration and substrate temperature on the nano-scale interfacial structure for
bonding strength were investigated using high resolution transmission electron microscopy. It shows
that intermetallic compound crystallization correlates with bonding duration, as a longer duration is
applied, alumina fragmentation becomes pervasive, resulting in continuous alloy interfaces and robust
bonds. In addition, a substrate temperature (i.e. 175 C) promotes the fracture of alumina, and simultaneously
contributes to the interfacial temperature, accelerating interdiffusion and facilitating the formation
of intermetallic compounds, therefore increasing bonding strength. The compound formed during
bonding is CuAl2, regardless of the bonding parameters applied. |
author2 |
School of Materials Science & Engineering |
author_facet |
School of Materials Science & Engineering Xu, Hui Liu, Changqing Chen, Z. Wei, J. Sivakumar, M. Silberschmidt, Vadim V. |
format |
Article |
author |
Xu, Hui Liu, Changqing Chen, Z. Wei, J. Sivakumar, M. Silberschmidt, Vadim V. |
author_sort |
Xu, Hui |
title |
Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution |
title_short |
Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution |
title_full |
Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution |
title_fullStr |
Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution |
title_full_unstemmed |
Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution |
title_sort |
effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a tem study of interfacial evolution |
publishDate |
2012 |
url |
https://hdl.handle.net/10356/79549 http://hdl.handle.net/10220/8242 |
_version_ |
1773551310875918336 |