Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution

The effect of bonding duration and substrate temperature on the nano-scale interfacial structure for bonding strength were investigated using high resolution transmission electron microscopy. It shows that intermetallic compound crystallization correlates with bonding duration, as a lo...

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Main Authors: Xu, Hui, Liu, Changqing, Chen, Z., Wei, J., Sivakumar, M., Silberschmidt, Vadim V.
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2012
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Online Access:https://hdl.handle.net/10356/79549
http://hdl.handle.net/10220/8242
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-795492023-07-14T15:57:28Z Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution Xu, Hui Liu, Changqing Chen, Z. Wei, J. Sivakumar, M. Silberschmidt, Vadim V. School of Materials Science & Engineering DRNTU::Engineering::Materials The effect of bonding duration and substrate temperature on the nano-scale interfacial structure for bonding strength were investigated using high resolution transmission electron microscopy. It shows that intermetallic compound crystallization correlates with bonding duration, as a longer duration is applied, alumina fragmentation becomes pervasive, resulting in continuous alloy interfaces and robust bonds. In addition, a substrate temperature (i.e. 175 C) promotes the fracture of alumina, and simultaneously contributes to the interfacial temperature, accelerating interdiffusion and facilitating the formation of intermetallic compounds, therefore increasing bonding strength. The compound formed during bonding is CuAl2, regardless of the bonding parameters applied. Accepted version 2012-06-27T02:57:34Z 2019-12-06T13:28:02Z 2012-06-27T02:57:34Z 2019-12-06T13:28:02Z 2010 2010 Journal Article Xu, H., Liu, C., Silberschmidt, V. V., Chen, Z., Wei, J., & Sivakumar, M. (2011). Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads: a TEM study of interfacial evolution. Microelectronics reliability, 51(1), 113-118. 0026-2714 https://hdl.handle.net/10356/79549 http://hdl.handle.net/10220/8242 10.1016/j.microrel.2010.03.016 en Microelectronics reliability © 2010 Elsevier. This is the author created version of a work that has been peer reviewed and accepted for publication by Microelectronics Reliability, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.microrel.2010.03.016]. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials
spellingShingle DRNTU::Engineering::Materials
Xu, Hui
Liu, Changqing
Chen, Z.
Wei, J.
Sivakumar, M.
Silberschmidt, Vadim V.
Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution
description The effect of bonding duration and substrate temperature on the nano-scale interfacial structure for bonding strength were investigated using high resolution transmission electron microscopy. It shows that intermetallic compound crystallization correlates with bonding duration, as a longer duration is applied, alumina fragmentation becomes pervasive, resulting in continuous alloy interfaces and robust bonds. In addition, a substrate temperature (i.e. 175 C) promotes the fracture of alumina, and simultaneously contributes to the interfacial temperature, accelerating interdiffusion and facilitating the formation of intermetallic compounds, therefore increasing bonding strength. The compound formed during bonding is CuAl2, regardless of the bonding parameters applied.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Xu, Hui
Liu, Changqing
Chen, Z.
Wei, J.
Sivakumar, M.
Silberschmidt, Vadim V.
format Article
author Xu, Hui
Liu, Changqing
Chen, Z.
Wei, J.
Sivakumar, M.
Silberschmidt, Vadim V.
author_sort Xu, Hui
title Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution
title_short Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution
title_full Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution
title_fullStr Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution
title_full_unstemmed Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a TEM study of interfacial evolution
title_sort effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads : a tem study of interfacial evolution
publishDate 2012
url https://hdl.handle.net/10356/79549
http://hdl.handle.net/10220/8242
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