0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization
In sub/near-threshold operation, SRAMs suffer from considerable bitline swing degradation when the data pattern of a column is skewed to ‘1’ or ‘0’. The worst scenarios regarding this problem occur when the currently read SRAM cell has different data compared to the rest of the cells in the same col...
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| Main Authors: | , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2016
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/84030 http://hdl.handle.net/10220/41563 |
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| Institution: | Nanyang Technological University |
| Language: | English |