Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures
Resistive switching behavior of partially anodized aluminum thin film has been investigated at temperatures of 25 °C–250 °C. Both the reset and set voltages decrease with increasing temperature, showing Arrhenius-like dependence with small activation energies. The pulse voltage experiment also sugge...
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Main Authors: | Zhu, Wei, Chen, Tupei, Yang, Ming, Liu, Yang, Fung, Stevenson Hon Yuen |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/98989 http://hdl.handle.net/10220/13478 |
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Institution: | Nanyang Technological University |
Language: | English |
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