Oxidation behaviour of Cu thin films on Si wafer at 175-400°C
10.1016/S0167-577X(01)00268-3
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Main Authors: | Gao, W., Gong, H., He, J., Thomas, A., Chan, L., Li, S. |
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Other Authors: | MATERIALS SCIENCE |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/107159 |
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Institution: | National University of Singapore |
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