Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS

Saved in:

Bibliographic Details
Main Authors:	Hoex, Bram, Bosman, Michel, Nandakumar, Naomi, Kessels, WMM
Other Authors:	MATERIALS SCIENCE AND ENGINEERING
Format:	Article
Language:	English
Published:	WILEY-V C H VERLAG GMBH 2019
Subjects:	Science & Technology Technology Physical Sciences Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Materials Science Physics surface passivation Al2O3 electron energy loss spectroscopy silicon wafers solar cells CHEMICAL-VAPOR-DEPOSITION ATOMIC-LAYER-DEPOSITION ALD AL2O3 SI RECOMBINATION
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/155058
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-155058
record_format	dspace
spelling	sg-nus-scholar.10635-1550582024-04-17T02:44:22Z Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy Hoex, Bram Bosman, Michel Nandakumar, Naomi Kessels, WMM MATERIALS SCIENCE AND ENGINEERING SOLAR ENERGY RESEARCH INST OF S'PORE Science & Technology Technology Physical Sciences Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Materials Science Physics surface passivation Al2O3 electron energy loss spectroscopy silicon wafers solar cells CHEMICAL-VAPOR-DEPOSITION ATOMIC-LAYER-DEPOSITION ALD AL2O3 SI RECOMBINATION PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS 7 11 937-941 2019-06-03T04:43:45Z 2019-06-03T04:43:45Z 2013-11-01 2019-06-03T01:49:47Z Article Hoex, Bram, Bosman, Michel, Nandakumar, Naomi, Kessels, WMM (2013-11-01). Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS 7 (11) : 937-941. ScholarBank@NUS Repository. 1862-6254 1862-6270 https://scholarbank.nus.edu.sg/handle/10635/155058 000328321700001 en WILEY-V C H VERLAG GMBH Elements
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	Science & Technology Technology Physical Sciences Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Materials Science Physics surface passivation Al2O3 electron energy loss spectroscopy silicon wafers solar cells CHEMICAL-VAPOR-DEPOSITION ATOMIC-LAYER-DEPOSITION ALD AL2O3 SI RECOMBINATION
spellingShingle	Science & Technology Technology Physical Sciences Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Materials Science Physics surface passivation Al2O3 electron energy loss spectroscopy silicon wafers solar cells CHEMICAL-VAPOR-DEPOSITION ATOMIC-LAYER-DEPOSITION ALD AL2O3 SI RECOMBINATION Hoex, Bram Bosman, Michel Nandakumar, Naomi Kessels, WMM Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy
description	PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
author2	MATERIALS SCIENCE AND ENGINEERING
author_facet	MATERIALS SCIENCE AND ENGINEERING Hoex, Bram Bosman, Michel Nandakumar, Naomi Kessels, WMM
format	Article
author	Hoex, Bram Bosman, Michel Nandakumar, Naomi Kessels, WMM
author_sort	Hoex, Bram
title	Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy
title_short	Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy
title_full	Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy
title_fullStr	Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy
title_full_unstemmed	Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy
title_sort	silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy
publisher	WILEY-V C H VERLAG GMBH
publishDate	2019
url	https://scholarbank.nus.edu.sg/handle/10635/155058
_version_	1800913604380196864

Silicon surface passivation by aluminium oxide studied with electron energy loss spectroscopy

Similar Items