A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS

A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS

Master's

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	CHONG PEI FEN
مؤلفون آخرون:	ELECTRICAL AND COMPUTER ENGINEERING
التنسيق:	Theses and Dissertations
منشور في:	2019
الوصول للمادة أونلاين:	https://scholarbank.nus.edu.sg/handle/10635/158745
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
المؤسسة:	National University of Singapore

مواد مشابهة

A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS
بواسطة: CHONG PEI FEN
منشور في: (2019)

Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions
بواسطة: Chong, P.F., وآخرون
منشور في: (2014)

Effects of electron-beam lithography on thin gate oxide reliability
بواسطة: Chong, P.F., وآخرون
منشور في: (2014)

Electron-beam irradiation-induced gate oxide degradation
بواسطة: Cho, B.J., وآخرون
منشور في: (2014)

Reliability of thin gate oxides irradiated under X-ray lithography conditions
بواسطة: Cho, B.J., وآخرون
منشور في: (2014)

Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation
بواسطة: Cho, B.J., وآخرون
منشور في: (2014)

Characterization of leakage current in thin gate oxide subjected to 10 KeV X-ray irradiation
بواسطة: Ling, C.H., وآخرون
منشور في: (2014)

Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides
بواسطة: Loh, W.Y., وآخرون
منشور في: (2014)

Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
بواسطة: Ang, C.H., وآخرون
منشور في: (2014)

Characterization of gate oxide degradation caused by electrical stress
بواسطة: Huang, Jiayi.
منشور في: (2008)

Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides
بواسطة: HUANG JINSHENG
منشور في: (2010)

Stress-induced leakage current in ultra-thin gate oxide
بواسطة: Ang, Kheng Guan
منشور في: (2008)

The charging behaviour and internal electric field of PMMA irradiated by a kiloelectronvolt electron beam
بواسطة: Chen, H., وآخرون
منشور في: (2014)

Color enhancement of tourmaline by electron beam irradiation
بواسطة: Waratchanok Suwanmanee
منشور في: (2019)

On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack
بواسطة: Samanta, P., وآخرون
منشور في: (2014)

Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias
بواسطة: Ang, Chew-Hoe, وآخرون
منشور في: (2014)

Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
بواسطة: Teh, G.L., وآخرون
منشور في: (2014)

Localized insulator-conductor transformation of graphene oxide thin films via focused laser beam irradiation
بواسطة: Tao, Y., وآخرون
منشور في: (2014)

Reliability modeling of ultra-thin gate oxide and high-k dielectrics for nano-scale CMOS devices
بواسطة: LOH WEI YIP
منشور في: (2010)

Contact stresses in beams subjected to bending
بواسطة: Wang, Jianhong.
منشور في: (2008)

DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES
بواسطة: NG WEE THONG
منشور في: (2020)

Secondary and backscattered electron yields of polymer surface under electron beam irradiation
بواسطة: Song, Z.G., وآخرون
منشور في: (2014)

Stress-induced leakage current and lateral nonuniform charge generation in thermal oxides subjected to negative-gate-voltage impulse stressing
بواسطة: Lim, P.S., وآخرون
منشور في: (2014)

Adhesion and self-adhesion of rubbers, crosslinked by electron beam irradiation
بواسطة: Wirasak Smitthipong, وآخرون
منشور في: (2018)

Space-charge dynamics of polymethylmethacrylate under electron beam irradiation
بواسطة: Gong, H., وآخرون
منشور في: (2014)

ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE
بواسطة: OOI JOO AIK
منشور في: (2020)

Electrical characteristics of Si nanocrystal distributed in a narrow layer in the gate oxide near the gate synthesized with very-low-energy ion beams
بواسطة: Ng, Chi Yung, وآخرون
منشور في: (2010)

Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
بواسطة: Ang, C.-H., وآخرون
منشور في: (2014)

High-k hafnium oxide based thin films using laser molecular beam epitaxy for gate dielectrics
بواسطة: Lu, Yuekang
منشور في: (2008)

Synthesis of electron beam irradiated hydrogel beads for disaster relief applications
بواسطة: Oh, Jessica Si Jia
منشور في: (2012)

Influence of electron-beam irradiation on in-vitro hydrolytic degradation of biodegradable polymer
بواسطة: Ong, Brenda Si Ying.
منشور في: (2012)

The trapping and distribution of charge in polarized polymethylmethacrylate under electron-beam irradiation
بواسطة: Song, Z.G., وآخرون
منشور في: (2014)

Evolution of quasi-breakdown in thin gate oxides
بواسطة: Loh, W.Y., وآخرون
منشور في: (2014)

Significant enhancement of UV emission in ZnO nanorods subject to Ga+ ion beam irradiation
بواسطة: Yadian, Boluo, وآخرون
منشور في: (2017)

Proton beam micromachining: Electron emission from SU-8 resist during ion beam irradiation
بواسطة: Bettiol, A.A., وآخرون
منشور في: (2014)

STUDY OF GATE VOLTAGE STRESS AND VISIBLE LIGHT IRRADIATION ON MOS2 BASED GAS SENSORS
بواسطة: TONG YU
منشور في: (2017)

MeV single-ion beam irradiation of mammalian cells using the Surrey vertical nanobeam, compared with broad proton beam and X-ray irradiations
بواسطة: K. Prakrajang, وآخرون
منشور في: (2018)

MeV single-ion beam irradiation of mammalian cells using the Surrey vertical nanobeam, compared with broad proton beam and X-ray irradiations
بواسطة: K. Prakrajang, وآخرون
منشور في: (2018)

Dynamics aspects of the charging behaviour of polymers under focused electron beam irradiation
بواسطة: Ong, C.K., وآخرون
منشور في: (2014)

Electron-beam-irradiated rhenium disulfide memristors with low variability for neuromorphic computing
بواسطة: Sifan Li, Bochang Li, وآخرون
منشور في: (2022)