Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons

US5468967

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Bibliographic Details
Main Authors: CHAN, DANIEL S. H., LEONG, KIN, PHANG, JACOB C. H.
Other Authors: ELECTRICAL ENGINEERING
Format: Patent
Published: 2012
Online Access:http://scholarbank.nus.edu.sg/handle/10635/32538
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Institution: National University of Singapore

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