Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons
US5468967
Saved in:
Main Authors: | CHAN, DANIEL S. H., LEONG, KIN, PHANG, JACOB C. H. |
---|---|
Other Authors: | ELECTRICAL ENGINEERING |
Format: | Patent |
Published: |
2012
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/32538 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
High efficiency cathodoluminescence detector with high discrimination against backscattered electrons
by: PHANG, JACOB C. H., et al.
Published: (2012) -
Design and characterisation of a single-reflection, solid-state detector with high discrimination against backscattered electrons for cathodoluminescence microscopy
by: Pey, K.L., et al.
Published: (2014) -
Cathodoluminescence detector
by: PHANG, JACOB CHEE HONG, et al.
Published: (2012) -
Cathodoluminescence detector
by: PHANG, JACOB CHEE HONG, et al.
Published: (2012) -
Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimens
by: PHANG, J. C. H., et al.
Published: (2012)