A mechanism of field-oxide-ungrowth phenomenon in recessed isolation process and practical solution
Journal of the Electrochemical Society
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Main Authors: | Jang, S.-A., Kim, Y.-B., Cho, B.-J., Kim, J.-C. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/54339 |
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Institution: | National University of Singapore |
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