A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing method
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Main Authors: | Ong, K.H., Phang, J.C.H., Thong, J.T.L. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/54792 |
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Institution: | National University of Singapore |
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