Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors

10.1063/1.1871351

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Main Authors: Ang, K.-W., Chui, K.-J., Bliznetsov, V., Tung, C.-H., Du, A., Balasubramanian, N., Samudra, G., Li, M.F., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56472
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-564722023-10-29T23:03:08Z Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors Ang, K.-W. Chui, K.-J. Bliznetsov, V. Tung, C.-H. Du, A. Balasubramanian, N. Samudra, G. Li, M.F. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1871351 Applied Physics Letters 86 9 1-3 APPLA 2014-06-17T02:54:58Z 2014-06-17T02:54:58Z 2005-02-28 Article Ang, K.-W., Chui, K.-J., Bliznetsov, V., Tung, C.-H., Du, A., Balasubramanian, N., Samudra, G., Li, M.F., Yeo, Y.-C. (2005-02-28). Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors. Applied Physics Letters 86 (9) : 1-3. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1871351 00036951 http://scholarbank.nus.edu.sg/handle/10635/56472 000228991600053 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1871351
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Ang, K.-W.
Chui, K.-J.
Bliznetsov, V.
Tung, C.-H.
Du, A.
Balasubramanian, N.
Samudra, G.
Li, M.F.
Yeo, Y.-C.
format Article
author Ang, K.-W.
Chui, K.-J.
Bliznetsov, V.
Tung, C.-H.
Du, A.
Balasubramanian, N.
Samudra, G.
Li, M.F.
Yeo, Y.-C.
spellingShingle Ang, K.-W.
Chui, K.-J.
Bliznetsov, V.
Tung, C.-H.
Du, A.
Balasubramanian, N.
Samudra, G.
Li, M.F.
Yeo, Y.-C.
Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors
author_sort Ang, K.-W.
title Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors
title_short Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors
title_full Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors
title_fullStr Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors
title_full_unstemmed Lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors
title_sort lattice strain analysis of transistor structures with silicon-germanium and silicon-carbon sourcedrain stressors
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/56472
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