Monolithic multichannel secondary electron detector for distributed axis electron beam lithography and inspection
10.1116/1.2804611
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Main Authors: | Pickard, D.S., Kenney, C., Tanimoto, S., Crane, T., Groves, T., Pease, R.F.W. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56693 |
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Institution: | National University of Singapore |
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