Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubes
Scanning
Saved in:
Main Authors: | Wong, W.K., Nojeh, A., Pease, R.F.W. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56990 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Reduction of charging effects using vector scanning in the scanning electron microscope
by: Thong, J.T.L., et al.
Published: (2014) -
A novel method for the discharge of electrostatic mirror formations in the scanning electron microscope
by: Wong, W.K., et al.
Published: (2014) -
Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current
by: Meng, L., et al.
Published: (2014) -
Advanced Electron-Beam Techniques for Solar Cell Characterization
by: MENG LEI
Published: (2014) -
Ultimate resolution limits for scanning electron microscope immersion objective lenses
by: Khursheed, A.
Published: (2014)