Secondary electron detection for distributed axis electron beam systems

10.1016/j.mee.2008.05.021

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Bibliographic Details
Main Authors: Tanimoto, S., Pickard, D.S., Kenney, C., Pease, R.F.W.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57343
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Institution: National University of Singapore

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