Temperature independent current biasing employing TFET

Temperature independent current biasing employing TFET

10.1049/el.2010.1064

Saved in:
Bibliographic Details
Main Authors: Guo, P.F., Yang, Y., Samudra, G., Heng, C.H., Yeo, Y.C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57604
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/57604

Similar Items