Temperature independent current biasing employing TFET
10.1049/el.2010.1064
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sg-nus-scholar.10635-576042023-10-26T21:40:12Z Temperature independent current biasing employing TFET Guo, P.F. Yang, Y. Samudra, G. Heng, C.H. Yeo, Y.C. ELECTRICAL & COMPUTER ENGINEERING 10.1049/el.2010.1064 Electronics Letters 46 11 786-787 ELLEA 2014-06-17T03:08:05Z 2014-06-17T03:08:05Z 2010-05-27 Article Guo, P.F., Yang, Y., Samudra, G., Heng, C.H., Yeo, Y.C. (2010-05-27). Temperature independent current biasing employing TFET. Electronics Letters 46 (11) : 786-787. ScholarBank@NUS Repository. https://doi.org/10.1049/el.2010.1064 00135194 http://scholarbank.nus.edu.sg/handle/10635/57604 000279091200035 Scopus |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Guo, P.F. Yang, Y. Samudra, G. Heng, C.H. Yeo, Y.C. |
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Guo, P.F. Yang, Y. Samudra, G. Heng, C.H. Yeo, Y.C. |
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Guo, P.F. Yang, Y. Samudra, G. Heng, C.H. Yeo, Y.C. Temperature independent current biasing employing TFET |
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Guo, P.F. |
title |
Temperature independent current biasing employing TFET |
title_short |
Temperature independent current biasing employing TFET |
title_full |
Temperature independent current biasing employing TFET |
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Temperature independent current biasing employing TFET |
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Temperature independent current biasing employing TFET |
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temperature independent current biasing employing tfet |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/57604 |
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