Wirebond deformation during molding of IC packages
Journal of Electronic Packaging, Transactions of the ASME
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Main Authors: | Tay, A.A.O., Yeo, K.S., Wu, J.H., Lim, T.B. |
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Other Authors: | INSTITUTE OF MICROELECTRONICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/58929 |
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Institution: | National University of Singapore |
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