Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM / ESEM-hybrid-system
10.1109/IRPS.2009.5173273
Saved in:
Main Authors: | Tiedemann, A.-K., Heiderhoff, R., Balk, L.J., Phang, J.C.H. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70147 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)
by: Lee, T.H., et al.
Published: (2014) -
Failure analysis of integrated devices by Scanning Thermal Microscopy (SThM)
by: Fiege, G.B.M., et al.
Published: (2014) -
Incorporation of dielectric layer onto SThM tips for direct thermal analysis
by: HU, CHANG CHAUN, et al.
Published: (2012) -
Non-linear thermal conductivity enhancement in nanocomposites with aligned-CNT implementation
by: Yamamoto, N., et al.
Published: (2016) -
Conduction heat transfer switching using magnetic FeₓOᵧ -decorated carbon-based nanomaterials
by: Goei, Ronn, et al.
Published: (2022)