In situ boron (B) doped germanium (Ge:B) grown on (100), (110), and (111) silicon: Crystal orientation and b incorporation effects
10.1149/05009.1025ecst
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Main Authors: | Han, G., Zhou, Q., Guo, P., Wang, W., Yang, Y., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70572 |
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Institution: | National University of Singapore |
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