Interplay of defects, microstructures, and surface stoichiometry during plasma processing of GaN

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Ramam, A., Tripathy, S., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70654
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Institution: National University of Singapore

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