Mask error enhancement factor for sub 0.13μm lithography
10.1117/12.435788
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Main Authors: | Tan, S.K., Lin, Q., Quan, C., Tay, C.J., See, A. |
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Other Authors: | PHYSICS |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73584 |
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Institution: | National University of Singapore |
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