Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy
10.1088/0022-3727/30/17/007
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2014
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sg-nus-scholar.10635-803612023-10-25T21:59:23Z Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy Chim, W.K. Chan, D.S.H. Tao, J.M. Lou, C.L. Leang, S.E. Teow, C.K. ELECTRICAL ENGINEERING 10.1088/0022-3727/30/17/007 Journal of Physics D: Applied Physics 30 17 2411-2420 JPAPB 2014-10-07T02:56:41Z 2014-10-07T02:56:41Z 1997-09-07 Article Chim, W.K., Chan, D.S.H., Tao, J.M., Lou, C.L., Leang, S.E., Teow, C.K. (1997-09-07). Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy. Journal of Physics D: Applied Physics 30 (17) : 2411-2420. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/30/17/007 00223727 http://scholarbank.nus.edu.sg/handle/10635/80361 A1997XW06100007 Scopus |
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National University of Singapore |
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Singapore Singapore |
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| description |
10.1088/0022-3727/30/17/007 |
| author2 |
ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Chim, W.K. Chan, D.S.H. Tao, J.M. Lou, C.L. Leang, S.E. Teow, C.K. |
| format |
Article |
| author |
Chim, W.K. Chan, D.S.H. Tao, J.M. Lou, C.L. Leang, S.E. Teow, C.K. |
| spellingShingle |
Chim, W.K. Chan, D.S.H. Tao, J.M. Lou, C.L. Leang, S.E. Teow, C.K. Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy |
| author_sort |
Chim, W.K. |
| title |
Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy |
| title_short |
Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy |
| title_full |
Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy |
| title_fullStr |
Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy |
| title_full_unstemmed |
Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy |
| title_sort |
distinguishing the effects of oxide trapped charges and interface states in ddd and latid nmosfets using photon emission spectroscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80361 |
| _version_ |
1781783901711106048 |