Hot-electron degradation in NMOSFET's: Results from temperature anneal
10.1109/16.293364
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sg-nus-scholar.10635-805482023-10-29T22:33:41Z Hot-electron degradation in NMOSFET's: Results from temperature anneal Ling, C.H. Ah, L.K. Choi, W.K. Tan, S.E. Ang, D.S. ELECTRICAL ENGINEERING 10.1109/16.293364 IEEE Transactions on Electron Devices 41 7 1303-1305 IETDA 2014-10-07T02:58:44Z 2014-10-07T02:58:44Z 1994-07 Article Ling, C.H., Ah, L.K., Choi, W.K., Tan, S.E., Ang, D.S. (1994-07). Hot-electron degradation in NMOSFET's: Results from temperature anneal. IEEE Transactions on Electron Devices 41 (7) : 1303-1305. ScholarBank@NUS Repository. https://doi.org/10.1109/16.293364 00189383 http://scholarbank.nus.edu.sg/handle/10635/80548 A1994NV88600031 Scopus |
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Singapore Singapore |
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10.1109/16.293364 |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Ling, C.H. Ah, L.K. Choi, W.K. Tan, S.E. Ang, D.S. |
| format |
Article |
| author |
Ling, C.H. Ah, L.K. Choi, W.K. Tan, S.E. Ang, D.S. |
| spellingShingle |
Ling, C.H. Ah, L.K. Choi, W.K. Tan, S.E. Ang, D.S. Hot-electron degradation in NMOSFET's: Results from temperature anneal |
| author_sort |
Ling, C.H. |
| title |
Hot-electron degradation in NMOSFET's: Results from temperature anneal |
| title_short |
Hot-electron degradation in NMOSFET's: Results from temperature anneal |
| title_full |
Hot-electron degradation in NMOSFET's: Results from temperature anneal |
| title_fullStr |
Hot-electron degradation in NMOSFET's: Results from temperature anneal |
| title_full_unstemmed |
Hot-electron degradation in NMOSFET's: Results from temperature anneal |
| title_sort |
hot-electron degradation in nmosfet's: results from temperature anneal |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80548 |
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1781783918940258304 |