Investigation of some aspects of the liquid crystal optical voltage contrast technique for integrated circuit physical analysis

Microelectronics Reliability

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Bibliographic Details
Main Authors: Chim, W.K., Chan, D.S.H., Phang, J.C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80636
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Institution: National University of Singapore

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