Characterization of Ni- and Ni(Pt)-silicide formation on narrow polycrystalline Si lines by Raman spectroscopy

Materials Research Society Symposium - Proceedings

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書目詳細資料
Main Authors: Lee, P.S., Mangelinck, D., Pey, K.L., Ding, J., Osipowicz, T., Ho, C.S., Chen, G.L., Chan, L.
其他作者: ELECTRICAL ENGINEERING
格式: Conference or Workshop Item
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/81387
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總結:Materials Research Society Symposium - Proceedings