Characterization of Ni- and Ni(Pt)-silicide formation on narrow polycrystalline Si lines by Raman spectroscopy
Materials Research Society Symposium - Proceedings
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Main Authors: | Lee, P.S., Mangelinck, D., Pey, K.L., Ding, J., Osipowicz, T., Ho, C.S., Chen, G.L., Chan, L. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81387 |
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Institution: | National University of Singapore |
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