Characterization of Ni- and Ni(Pt)-silicide formation on narrow polycrystalline Si lines by Raman spectroscopy

Materials Research Society Symposium - Proceedings

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Bibliographic Details
Main Authors: Lee, P.S., Mangelinck, D., Pey, K.L., Ding, J., Osipowicz, T., Ho, C.S., Chen, G.L., Chan, L.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81387
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Institution: National University of Singapore

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