Gate-induced drain leakage current enhanced by plasma charging damage

10.1109/16.918252

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Bibliographic Details
Main Authors:	Ma, S., Zhang, Y., Li, M.F., Li, W., Xie, J., Sheng, G.T.T., Yen, A.C., Wang, J.L.F.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	CMOSFET Leakage current Plasma charging damage
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82401
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82401
record_format	dspace
spelling	sg-nus-scholar.10635-824012023-10-25T22:04:43Z Gate-induced drain leakage current enhanced by plasma charging damage Ma, S. Zhang, Y. Li, M.F. Li, W. Xie, J. Sheng, G.T.T. Yen, A.C. Wang, J.L.F. ELECTRICAL & COMPUTER ENGINEERING CMOSFET Leakage current Plasma charging damage 10.1109/16.918252 IEEE Transactions on Electron Devices 48 5 1006-1008 IETDA 2014-10-07T04:28:58Z 2014-10-07T04:28:58Z 2001-05 Article Ma, S., Zhang, Y., Li, M.F., Li, W., Xie, J., Sheng, G.T.T., Yen, A.C., Wang, J.L.F. (2001-05). Gate-induced drain leakage current enhanced by plasma charging damage. IEEE Transactions on Electron Devices 48 (5) : 1006-1008. ScholarBank@NUS Repository. https://doi.org/10.1109/16.918252 00189383 http://scholarbank.nus.edu.sg/handle/10635/82401 000168361000027 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	CMOSFET Leakage current Plasma charging damage
spellingShingle	CMOSFET Leakage current Plasma charging damage Ma, S. Zhang, Y. Li, M.F. Li, W. Xie, J. Sheng, G.T.T. Yen, A.C. Wang, J.L.F. Gate-induced drain leakage current enhanced by plasma charging damage
description	10.1109/16.918252
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ma, S. Zhang, Y. Li, M.F. Li, W. Xie, J. Sheng, G.T.T. Yen, A.C. Wang, J.L.F.
format	Article
author	Ma, S. Zhang, Y. Li, M.F. Li, W. Xie, J. Sheng, G.T.T. Yen, A.C. Wang, J.L.F.
author_sort	Ma, S.
title	Gate-induced drain leakage current enhanced by plasma charging damage
title_short	Gate-induced drain leakage current enhanced by plasma charging damage
title_full	Gate-induced drain leakage current enhanced by plasma charging damage
title_fullStr	Gate-induced drain leakage current enhanced by plasma charging damage
title_full_unstemmed	Gate-induced drain leakage current enhanced by plasma charging damage
title_sort	gate-induced drain leakage current enhanced by plasma charging damage
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82401
_version_	1781784128207716352

Gate-induced drain leakage current enhanced by plasma charging damage

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