Impacts of buffer oxide layer in nitride/oxide stack gate dielectrics on the device performance and dielectric reliability
10.1149/1.1455824
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Main Authors: | , , , , , , , , |
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Other Authors: | |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82500 |
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Institution: | National University of Singapore |
Summary: | 10.1149/1.1455824 |
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