Physical aging phenomenon of 6FDA-durene polyimide hollow fiber membranes

by Lin, W.-H., Chung, T.-S.
Published 2014

Gas permeability, diffusivity, solubility, and aging characteristics of 6FDA-durene polyimide membranes

by Lin, W.-H., Chung, T.-S.
Published 2014

Gas transport properties of 6FDA-durene/1,4-phenylenediamine (pPDA) copolyimides

by Lin, W.-H., Vora, R.H., Chung, T.-S.
Published 2014

The effect of shear rates on gas separation performance of 6FDA-durene polyimide hollow fibers

by Chung, T.-S., Lin, W.-H., Vora, R.H.
Published 2014

Gas transport properties of 6FDA-durene/1,3-phenylenediamine (mPDA) copolyimides

by Chung, T.-S., Lin, W.-H., Vora, R.H.
Published 2014

Physical analysis of Ti-migration in 33 Å gate oxide breakdown

by Pey, K.L., Tung, C.H., Lin, W.H., Radhakrishnan, M.K.
Published 2014

Size difference in dielectric-breakdown-induced epitaxy in narrow n- and p-metal oxide semiconductor field effect transistors

by Pey, K.L., Tung, C.H., Tang, L.J., Lin, W.H., Radhakrishnan, M.K.
Published 2014

Gate Dielectric-Breakdown-Induced Microstructural Damage in MOSFETs

by Tang, L.J., Pey, K.L., Tung, C.H., Radhakrishnan, M.K., Lin, W.H.
Published 2014

Gate dielectric degradation mechanism associated with DBIE evolution

by Pey, K.L., Ranjan, R., Tung, C.H., Tang, L.J., Lin, W.H., Radhakrishnan, M.K.
Published 2014

The statistical distribution of percolation current for soft breakdown in ultrathin gate oxide

by Lin, W.H., Pey, K.L., Dong, Z., Chooi, S.Y.M., Ang, C.H., Zheng, J.Z.
Published 2014

The statistical distribution of percolation current for soft breakdown in ultrathin gate oxide

by Lin, W.H., Pey, K.L., Dong, Z., Chooi, S.Y.M., Ang, C.H., Zheng, J.Z.
Published 2014

Structural analysis of breakdown in ultrathin gate dielectrics using transmission electron microscopy

by Pey, K.L., Tung, C.H., Tang, L.J., Ranjan, R., Radhakrishnan, M.K., Lin, W.H., Lombardo, S., Palumbo, F.
Published 2014

Structure of the breakdown spot during progressive breakdown of ultra-thin gate oxides

by Palumbo, F., Lombardo, S., Pey, K.L., Tang, L.J., Tung, C.H., Lin, W.H., Radhakrishnan, M.K., Falci, G.
Published 2014

Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM

by Pey, K.L., Tung, C.H., Radhakrishnan, M.K., Tang, L.J., Sun, Y., Wang, X.D., Lin, W.H.
Published 2014

Effects of post-deposition anneal on the electrical properties of Si3N4 gate dielectric

by Lin, W.H., Pey, K.L., Dong, Z., Chooi, S.Y.-M., Zhou, M.S., Ang, T.C., Ang, C.H., Lau, W.S., Ye, J.H.
Published 2014

Impacts of buffer oxide layer in nitride/oxide stack gate dielectrics on the device performance and dielectric reliability

by Lin, W.H., Pey, K.L., Dong, Z., Lim, V.S.K., Chooi, S.Y.M., Zhou, M.S., Ang, C.H., Ang, T.C., Lau, W.S.
Published 2014

Suppressed crystallization of Hf-based gate dielectrics by controlled addition of Al2O3 using atomic layer deposition

by Ho, M.-Y., Gong, H., Wilk, G.D., Busch, B.W., Green, M.L., Lin, W.H., See, A., Lahiri, S.K., Loomans, M.E., Räisänen, P.I., Gustafsson, T.
Published 2014

Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition

by Ho, M.-Y., Gong, H., Wilk, G.D., Busch, B.W., Green, M.L., Voyles, P.M., Muller, D.A., Bude, M., Lin, W.H., See, A., Loomans, M.E., Lahiri, S.K., Räisänen, P.I.
Published 2014

GenomegaMap: Within-Species Genome-Wide dN=dS Estimation from over 10,000 Genomes

by Wilson, Daniel J., Crook, D.W., Peto, T.E.A., Walker, A.S., Hoosdally, S.J., Gibertoni Cruz, A.L., Carter, J., Grazian, C., Earle, S.G., Kouchaki, S., Lachapelle, A., Yang, Y., Clifton, D.A., Fowler, P.W., Iqbal, Z., Hunt, M., Knaggs, J., Smith, E.G., Rathod, P., Jarrett, L., Matias, D., Cirillo, D.M., Borroni, E., Battaglia, S., Ghodousi, A., Spitaleri, A., Cabibbe, A., Tahseen, S., Nilgiriwala, K., Shah, S., Rodrigues, C., Kambli, P., Surve, U., Khot, R., Niemann, S., Kohl, T.A., Merker, M., Hoffmann, H., Todt, K., Plesnik, S., Ismail, N., Omar, S.V., Joseph, L., Thwaites, G., Thuong, T.N.T., Ngoc, N.H., Srinivasan, V., Walker, T.M., Moore, D., Coronel, J., Solano, W., Gao, G.F., He, G., Zhao, Y., Liu, C., Ma, A., Zhu, B., Laurenson, I., Claxton, P., Koch, A., Wilkinson, R., Lalvani, A., Posey, J., Gardy, J., Werngren, J., Nicholas Iain James Paton, Jou, R., Wu, M.-H., Lin, W.-H., Ferrazoli, L., de Oliveira, R.S., Arandjelovic, I., Chaiprasert, A., Comas, I., Drobniewski, F.A., Farhat, M.R., Gao, Q., Ong, Rick Twee Hee, Sintchenko, V., Supply, P., van Soolingen, D., The CRyPTIC Consortium.
Published 2022