Suppression of nitridation-induced interface traps and hole mobility degradation by nitrogen plasma nitridation

10.1149/1.1459682

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書目詳細資料
Main Authors: Ang, C.H., Tan, S.S., Lek, C.M., Lin, W., Zheng, Z.J., Chen, T., Cho, B.J.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/83119
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機構: National University of Singapore