Suppression of nitridation-induced interface traps and hole mobility degradation by nitrogen plasma nitridation
10.1149/1.1459682
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Main Authors: | Ang, C.H., Tan, S.S., Lek, C.M., Lin, W., Zheng, Z.J., Chen, T., Cho, B.J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83119 |
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Institution: | National University of Singapore |
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