50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner

Digest of Technical Papers - Symposium on VLSI Technology

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Main Authors: Ang, K.-W., Chui, K.-J., Chin, H.-C., Foo, Y.-L., Du, A., Deng, W., Li, M.-F., Samudra, G., Balasubramanian, N., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83301
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-833012015-01-13T23:30:46Z 50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner Ang, K.-W. Chui, K.-J. Chin, H.-C. Foo, Y.-L. Du, A. Deng, W. Li, M.-F. Samudra, G. Balasubramanian, N. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING Digest of Technical Papers - Symposium on VLSI Technology 66-67 DTPTE 2014-10-07T04:39:43Z 2014-10-07T04:39:43Z 2006 Conference Paper Ang, K.-W.,Chui, K.-J.,Chin, H.-C.,Foo, Y.-L.,Du, A.,Deng, W.,Li, M.-F.,Samudra, G.,Balasubramanian, N.,Yeo, Y.-C. (2006). 50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner. Digest of Technical Papers - Symposium on VLSI Technology : 66-67. ScholarBank@NUS Repository. 1424400058 07431562 http://scholarbank.nus.edu.sg/handle/10635/83301 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Digest of Technical Papers - Symposium on VLSI Technology
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Ang, K.-W.
Chui, K.-J.
Chin, H.-C.
Foo, Y.-L.
Du, A.
Deng, W.
Li, M.-F.
Samudra, G.
Balasubramanian, N.
Yeo, Y.-C.
format Conference or Workshop Item
author Ang, K.-W.
Chui, K.-J.
Chin, H.-C.
Foo, Y.-L.
Du, A.
Deng, W.
Li, M.-F.
Samudra, G.
Balasubramanian, N.
Yeo, Y.-C.
spellingShingle Ang, K.-W.
Chui, K.-J.
Chin, H.-C.
Foo, Y.-L.
Du, A.
Deng, W.
Li, M.-F.
Samudra, G.
Balasubramanian, N.
Yeo, Y.-C.
50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner
author_sort Ang, K.-W.
title 50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner
title_short 50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner
title_full 50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner
title_fullStr 50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner
title_full_unstemmed 50 nm silicon-on-insulator N-MOSFET featuring multiple stressors: Silicon-carbon source/drain regions and tensile stress silicon nitride liner
title_sort 50 nm silicon-on-insulator n-mosfet featuring multiple stressors: silicon-carbon source/drain regions and tensile stress silicon nitride liner
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83301
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