A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization

A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization

IEEE International Conference on Microelectronic Test Structures

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Bibliographic Details
Main Authors: Yeo, S.B., Bordelon, J., Chu, S., Li, M.F., Tranchina, B.A., Harward, M., Chan, L.H., See, A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83419
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Institution: National University of Singapore
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Summary:IEEE International Conference on Microelectronic Test Structures

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