A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization

• Main Authors: Yeo, S.B., Bordelon, J., Chu, S., Li, M.F., Tranchina, B.A., Harward, M., Chan, L.H., See, A.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/83419
• Institution: National University of Singapore

IEEE International Conference on Microelectronic Test Structures