A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization

IEEE International Conference on Microelectronic Test Structures

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Bibliographic Details
Main Authors:	Yeo, S.B., Bordelon, J., Chu, S., Li, M.F., Tranchina, B.A., Harward, M., Chan, L.H., See, A.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83419
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-83419
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spelling	sg-nus-scholar.10635-834192015-01-07T19:17:45Z A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization Yeo, S.B. Bordelon, J. Chu, S. Li, M.F. Tranchina, B.A. Harward, M. Chan, L.H. See, A. ELECTRICAL & COMPUTER ENGINEERING IEEE International Conference on Microelectronic Test Structures 229-234 PIMTE 2014-10-07T04:41:02Z 2014-10-07T04:41:02Z 2002 Conference Paper Yeo, S.B.,Bordelon, J.,Chu, S.,Li, M.F.,Tranchina, B.A.,Harward, M.,Chan, L.H.,See, A. (2002). A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization. IEEE International Conference on Microelectronic Test Structures : 229-234. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/83419 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	IEEE International Conference on Microelectronic Test Structures
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Yeo, S.B. Bordelon, J. Chu, S. Li, M.F. Tranchina, B.A. Harward, M. Chan, L.H. See, A.
format	Conference or Workshop Item
author	Yeo, S.B. Bordelon, J. Chu, S. Li, M.F. Tranchina, B.A. Harward, M. Chan, L.H. See, A.
spellingShingle	Yeo, S.B. Bordelon, J. Chu, S. Li, M.F. Tranchina, B.A. Harward, M. Chan, L.H. See, A. A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization
author_sort	Yeo, S.B.
title	A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization
title_short	A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization
title_full	A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization
title_fullStr	A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization
title_full_unstemmed	A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization
title_sort	robust and production worthy addressable array architecture for deep sub-micron mosfet's matching characterization
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/83419
_version_	1681089432380243968

A robust and production worthy addressable array architecture for deep sub-micron MOSFET's matching characterization

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