Effects of O2 and Ar reactive ion etching on the field emission properties of aligned CuO nanowire films

Diffusion and Defect Data Pt.B: Solid State Phenomena

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Bibliographic Details
Main Authors: Zhu, Y.W., Teo, C.H., Xu, X.J., Yu, T., Lim, C.T., Ong, C.K., Thong, J.T.L., Sow, C.H.
Other Authors: NUS NANOSCIENCE & NANOTECH INITIATIVE
Format: Conference or Workshop Item
Published: 2014
Subjects:
CuO
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83682
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Institution: National University of Singapore

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