Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors
10.1109/RELPHY.2007.369569
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2014
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sg-nus-scholar.10635-838042023-10-29T20:48:56Z Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors Ang, K.-W. Wan, C. Chui, K.-J. Tung, C.-H. Balasubramanian, N. Li, M.-F. Samudra, G. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/RELPHY.2007.369569 Annual Proceedings - Reliability Physics (Symposium) 684-685 ARLPB 2014-10-07T04:45:23Z 2014-10-07T04:45:23Z 2007 Conference Paper Ang, K.-W., Wan, C., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G., Yeo, Y.-C. (2007). Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors. Annual Proceedings - Reliability Physics (Symposium) : 684-685. ScholarBank@NUS Repository. https://doi.org/10.1109/RELPHY.2007.369569 1424409195 00999512 http://scholarbank.nus.edu.sg/handle/10635/83804 000246989600153 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| description |
10.1109/RELPHY.2007.369569 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Ang, K.-W. Wan, C. Chui, K.-J. Tung, C.-H. Balasubramanian, N. Li, M.-F. Samudra, G. Yeo, Y.-C. |
| format |
Conference or Workshop Item |
| author |
Ang, K.-W. Wan, C. Chui, K.-J. Tung, C.-H. Balasubramanian, N. Li, M.-F. Samudra, G. Yeo, Y.-C. |
| spellingShingle |
Ang, K.-W. Wan, C. Chui, K.-J. Tung, C.-H. Balasubramanian, N. Li, M.-F. Samudra, G. Yeo, Y.-C. Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors |
| author_sort |
Ang, K.-W. |
| title |
Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors |
| title_short |
Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors |
| title_full |
Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors |
| title_fullStr |
Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors |
| title_full_unstemmed |
Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors |
| title_sort |
hot carrier reliability of strained n-mosfet with lattice mismatched source/drain stressors |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/83804 |
| _version_ |
1781784392491859968 |