Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors
10.1109/RELPHY.2007.369569
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Main Authors: | Ang, K.-W., Wan, C., Chui, K.-J., Tung, C.-H., Balasubramanian, N., Li, M.-F., Samudra, G., Yeo, Y.-C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83804 |
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Institution: | National University of Singapore |
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