Improved current drivability and gate stack integrity using buried SiC layer for strained Si/SiGe channel devices
10.1149/1.2727393
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Main Authors: | , , , , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83827 |
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Institution: | National University of Singapore |
Summary: | 10.1149/1.2727393 |
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