Understanding and testing for drop impact failure

Proceedings of the ASME/Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems: Advances in Electronic Packaging 2005

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Bibliographic Details
Main Authors: Seah, S.K.W., Wong, E.H., Ranjan, R., Lim, C.T., Mai, Y.-W.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/86105
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Institution: National University of Singapore

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