Interface strain study of thin Lu2O3/Si using HRBS
10.1016/j.nimb.2007.12.090
Saved in:
Main Authors: | Chan, T.K., Darmawan, P., Ho, C.S., Malar, P., Lee, P.S., Osipowicz, T. |
---|---|
Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/96960 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
HRBS/channeling studies of ultra-thin ITO films on Si
by: Malar, P., et al.
Published: (2014) -
Interface strain study of thin Lu2O3/Si using HRBS
by: Chan, T. K., et al.
Published: (2013) -
A Faster Exact Algorithm to Count X3SAT Solutions
by: Hoi, G, et al.
Published: (2023) -
The CIBA high resolution RBS facility
by: Osipowicz, T., et al.
Published: (2011) -
The CIBA high resolution RBS facility
by: Osipowicz, T., et al.
Published: (2014)