Microstructural-property relationships of PZT
Characterization of pure and Pb(Y1/2Nb1/2)O3-doped Pb(Zr0.53/Ti0.47)O3 (PZT) with th morphotropic phase boundary composition has been undertaken in this study.
Saved in:
主要作者: | Qiu, Wei. |
---|---|
其他作者: | Hng, Huey Hoon |
格式: | Theses and Dissertations |
出版: |
2008
|
主題: | |
在線閱讀: | http://hdl.handle.net/10356/5101 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Development and characterization of PZT thin films
由: Zhou, Min.
出版: (2008) -
Investigation of substrate texturing on the microstructure and magnetic properties of cobalt-based thin film disk for magnetic recording
由: Hing, Peter.
出版: (2008) -
Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
由: Tan, Thiam Teck.
出版: (2008) -
Tribological and electrochemical properties of graphene
由: Francis Sunitha.
出版: (2011) -
Optical and optoelectronic properties of Si nanocrystals embedded in dielectric matrix
由: Ding, Liang
出版: (2009)