Development of failure assessment methodology for lead-free electronic assembly
In this study, reliability test and analysis methodology for lead-free (Pb-free) soldered assemblies subjected to thermal cycling, cyclic bend, drop impact and vibration loadings are investigated. Finite element analysis (FEA) is used as a numerical modeling tool for simulating solder micro-deformat...
Saved in:
Main Author: | Che, Fa Xing |
---|---|
Other Authors: | Pang Hock Lye, John |
Format: | Theses and Dissertations |
Published: |
2008
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/6473 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Similar Items
-
Development of a failure assessment methodology for flip chip electronic assembly
by: Yeo, Alfred Swain Hong.
Published: (2008) -
Study on the interconnection failure in lead-free soldered assemblies
by: Xu, Luhua
Published: (2008) -
Design-for-reliability methodology for evaluation of lead-free solder performance in electronic packaging assemblies
by: Pang, John Hock Lye
Published: (2008) -
Lead-free PCB assembly and effect of solder joint profile on the reliability of PCB assembly
by: Periannan Arulvanan.
Published: (2008) -
Product design for manufacture and assembly methodologies
by: Lu, Joyce Ruizhi.
Published: (2009)